Wilder Technologies SATA 2.5 Test Adapter Manual de usuario

High performance storage systems technology update and introduction to 12G physical layer validationJohn Calvin

Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdateSATA uBGA SSD’s present unique test challengesuBGA based test conf

Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdatePCIePCIe is multi-lane  scalable–1 to 16 lanesPCIe (Gen3) each

Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdatePCBPCIe Conn.PCIe/SATA Conn.PCBAccept only a x2 PCIe, or a x1 PCIe

Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdateDesktop Cables ConceptPCIe CableExisting SATA CablePCIe CablePCBPC

Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdateFundamentals of 12G SAS characterization14

Tektronix Technology Innovation Forum Spring 2012 High performance Storage Update12+G Design Problem:1000mV, FFE, Crosstalk, Crosstalk, Crosstalk,

Tektronix Technology Innovation Forum Spring 2012 High performance Storage Update12G Design Problem:FFE, DFE A non-recursive DFE can only compensa

Link Analysis in the context of SAS-12G SAS 12 (Passive Link) Tx Rx Compliance Points. (Source 11-416r3) SAS 12 (Active Link) Active Driver and Rec

Compliance Points Descriptions A TxRx connection is the complete simplex signal path between the transmitter circuit and the receiver circuit IT and

SDLA channel de-convolution and de-embedding Given a good set of channel S-Parameters, a clear model of SAS TC can be obtained for jitter and AC para

Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdateAgenda: High performance storage systems technology update and int

Another.. Better way? A brief treatise on the “PMC or SAS-3 Eye” Considered as a replacement for WDP Method: PMC (11-416r2 section X, 5.7.5.7.3)–

SAS-3 brings an advanced set of crosstalk models into the channel evaluation and simulation process. Tektronix Technology Innovation Forum Spring 2

SAS-3 Eye integrated into Scope’s MATLAB servicesTektronix Technology Innovation Forum Spring 201222

Tektronix Technology Innovation Forum Spring 2012Preliminary SAS-3 Tx PreC, PostC Requirements23 High performance Storage Update

Tektronix Technology Innovation Forum Spring 201224SPL-2 Transmitter Training (11-036r9)Transmission Training Information Unit (TTIU) SPL-2 introdu

Jitter Analysis AdvancesBUJ and relevance to multilane topologies25 Interconnect and board layout technology is advancing and the greatest area of fo

Tektronix Technology Innovation Forum Spring 201226SAS-3 (r00) Specs The Jitter and AC parametric measurements currently in the draft SAS-12G spec

Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdatePreliminary SAS-3 JTF RequirementsReference T10/11-221r4 R027

Tektronix Technology Innovation Forum Spring 201228 Classification of Rj and BUJ requires deep analysis into the lower probability regions of the c

ComprehensiveJitter Mapping tools 29 Tektronix Technology Innovation Forum Spring 2012

Tektronix Technology Innovation Forum Spring 2012Storage Timelines and Solutions DevelopmentToday2008 2009 2010 2011Gen 3- Silicon Phase6G Integrati

Tektronix Technology Innovation Forum Spring 201230 DPOJET applies straight-line fits on the Q scale of the combined Rj and NPJ CDF. The extent to

Tektronix Technology Innovation Forum Spring 201231Pure RjRj + BUJ

Tektronix Technology Innovation Forum Spring 2012 32BUJ on a 110011 (New BUJ Model –vs- Legacy).

Tektronix Technology Innovation Forum Spring 201233BUJ on a JTPAT (New BUJ Model –vs- Legacy).

 The Tektronix DSA7(33/25)04D Real Time Oscilloscope family offers the following interconnect specs.  2 Channel 100Gs/sec Sample rate at 33 GHz ana

SAS-3 Spec R00 BW RequirementsTektronix Technology Innovation Forum Spring 201235

Bandwidth ConsiderationsSAS PRBS11 12G NRZ Power Spectrum High performance Storage UpdateTektronix Technology Innovation Forum Spring 201236

Bandwidth ConsiderationsSignal Acquisition and bit rate harmonicsHigh performance Storage UpdateTektronix Technology Innovation Forum Spring 201237

Tektronix Technology Innovation Forum Spring 2012 High performance Storage Update3838Receiver Testing made easyHow the Family Fits TogetherDevice U

Tektronix Technology Innovation Forum Spring 2012 High performance Storage Update39Stressed Voltage Eye CalibrationStressed Pattern GeneratorAnalyz

Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdateSATA 3.1/ UTD 1.4.3 Spec Revisions4

Tektronix Technology Innovation Forum Spring 2012 High performance Storage Update40Stressed Voltage EyeStressed Pattern GenerationAnalyzerBERTScope

Tektronix Technology Innovation Forum Spring 201241Rx Results (BertScope)DATAT-MHz T-SJ SJ Bits Errors BER Status ThreshVX DelayPS2 0.1 4.52 6E+08 0

Tektronix Technology Innovation Forum Spring 201242Automated Tx Results (TekExpress full Auto)Test NameTest 5.2.1-TX SSC Modulation TypeTest 5.2.2-T

Waveform Distortion Penalty  Waveform Distortion Penalty (WDP/TWDP): Is a measurement method deployed in the SAS-2 spec. It uses acquired data aga

SAS/SATA Interconnect SolutionsTektronix Technology Innovation Forum Spring 201244Tektronix and Wilder Technologies have collaborated and jointly en

Mini-SAS HD Plug Test Adapter (right-hand)Top ViewsHigh-PerformanceMini-SAS HD Plug Connector Configuration16 SMAs forHigh-Speed Testing8 Position Low

Tektronix Technology Innovation Forum Spring 2012 46

12G SAS Instrument Solution Strategy Phase 0 (Silicon Designers): Transition into Phase 1 in November 2011 – Equivalent Time Instrument: ICR, BER C

Integrated and Automated Test ControlTekExpress™ Test Automation FrameworkTekExpress Instrument Topology for TSG/PHY/OOB, RSG testing Complete offeri

Tektronix Technology Innovation Forum Spring 2012Complete Tektronix 12G Instrument PortfolioReceiver Tests/Active Cable TestsRSG/RMT- Receiver Sili

Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdateIt’s the measurements ..SATA UTD 1.4.3 Test RequirementsPhy Trans

Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdateEnabling Innovation in the Digital Age50

Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdateSATA ECN 50: Asymmetric Amplitude and Measurement Methodology• Hos

Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdateSATA ECN 50: Asymmetric Amplitude and Measurement Methodology (con

Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdateEmbeddedApplicationsSATA BGAToday, SATA is expanding in specialize

Tektronix Technology Innovation Forum Spring 2012 High performance Storage UpdateSATA uBGA SSD’s present unique test challengesNew SSD’s approved b