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SATA2.5TestAdapterUserManual

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Page|16

©2010,2011WilderTechnologies,LLC

DocumentNo.910‐0011‐000Rev.B

SOLT

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SHORT,OPEN,LOAD,and2X‐THRU(SOLT)arecalibrationstandardsusedtocompensatefor

errorsassociatedwiththeTPAwhenusedforJittermeasurement,TDR,TDT,andVNAtesting.

SOLTrepresentsthesameelectricallengthandlossesastheTPAthroughtheSATAconnector

pad,andenablesthetestengineerto

compensateforthefollowingsixrepeatable,systematic

errorsthatoccurwhenmovingthereferenceplane:

 Signalleakageeffects:Directivityerrors

 Signalleakageeffects:Crosstalkerrors

 Reflectioneffects:SourceImpedanceMismatchingerrors

 Reflectioneffects:LoadImpedanceMismatchingerrors

 Bandwidtheffects:ReceiverTransmissioninTestEquipmenterrors

 Bandwidtheffects:ReceiverReflection‐trackinginTestEquipmenterrors

Theseerrorsneedtobecorrectedoneachport.RefertotheInstrumentManualfor

instructionsontheinstrument’sspecificcalibrationprocess.

NOTE:Thereferenceplaneistheboundary,bothphysicallyand

electrically,betweenthecalibratedanduncalibratedportionsof

thecircuit.Everythingoutsidethereferenceplaneisconsidered

partoftheDUT.Anyinstrumentthatdoesnotusecalibration

definestheDUTasthetotalofexternallyconnectedcomponents.

IftheSATA2.5‐TPA‐C‐1XorC‐2XCalibrationCablesarenot

used,all

oftheSATA2.5‐TPAandassociatedcoaxialcables,aswellascables

connectingtheTPAassemblytothetestinstrument,wouldbeapart

oftheDUT.

Non‐repeatableerrors,suchasdriftorrandomerrors,canbereducedbutnotcorrected.

Drifterrorsaggregateovertimeorwithenvironmentalchangessuchastemperatureshift.To

eliminatedrifterrors,performanothercalibration.

Arandomerrorcannotbecorrectedthroughcalibrationsincetheerroroccurredrandomly.

Randomerrorsare

typicallyassociatedwitheithertestinstrumentnoiseortestrepeatability

problems.Reducetestinstrumentnoisebyincreasingsourcepower,loweringtheIF

bandwidth,oraveragingresultsovermultiplesweeps.Reducetestrepeatabilityproblems

throughtheuseofatorquewrenchor,again,byaveragingovermultiplesweeps.

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