Wilder Technologies SATA 2.5 Test Adapter Especificaciones descargar pdf (Pagina 29)

Agilent Technologies, Inc.

Agilent Technologies, Inc. 29 SATA PHY, TSG & OOB Test MOI v.1.1 Revision 1.4

Test TSG-07 - Gen1 (1.5Gbps) TJ at Connector, Clock to Data, Fbaud/10

(Obsolete)

Note: This test is no longer required. It has been left here only for historical reference.

Purpose: Data-to-Data jitter is a measure of variance in the zero crossing times of edges at a fixed time

(tn) equal to an integer number of Unit intervals (n) after triggering on data edges (t0). Since t0 is triggered

from the serial signal rather than a Reference Clock the resulting measurements do represent a

combination of the jitter at t0 and tn.

References:

[1] SATA Interoperability Program Unified Test Document, 2.15.7 – TJ at Connector, Clock to Data,

Fbaud/10

Resource Requirements:

Same as for TSG-01.

Last Template Modification: May 7, 2006 (Version 1.02)

Discussion:

This measurement is no longer defined in Serial ATA Revision 3.0 and later.

Test TSG-08 - Gen1 (1.5Gbps) DJ at Connector, Clock to Data, Fbaud/10