Agilent Technologies, Inc.
Agilent Technologies, Inc. 75 SATA PHY, TSG & OOB Test MOI v.1.1 Revision 1.4
Appendix E – Calibration of Jitter Measurement Devices
Purpose: To calibrate and verify the jitter measurement device (JMD) and associated test setup has a proper
response to jitter and SSC.
References:
[1] SATA Specification Revision 3.0, Section 7.3.2
Resource requirements:
Pattern Generator for SATA signals
Sine wave source, 30kHz, and 0.5MHz to 50MHz.
Test cables
Jitter Measuring Device
Last Template Modification:
March 25, 2009 (Version 1.02)
Discussion:
See Reference [1].
Test Procedure:
The response to jitter of the Jitter Measurement Device (JMD)(the reference clock is part of the JMD) is
measured with three different jitter modulation frequencies corresponding to the three cases: 1) SSC (full tracking)
2) jitter (no tracking) 3) the boundary between SSC and jitter. The jitter source is independently verified by separate
means. This ensures the jitter response of the JMD is reproducible across different test setups.
The three Gen1i test signals are: 1) a 375MHz +/- 0.035% square wave (which is a D24.3, 00110011
pattern) with risetime between 67ps and 136ps 20 to 80% [1] with a sinusoidal phase modulation of 20.8ns +/- 10%
peak to peak at 30kHz +/- 1%. 2) a 375MHz square wave with a sinusoidal phase modulation of 200ps +/- 10%
peak to peak at 50MHz +/- 1%. 3) a 375MHz square wave with no modulation.
The three Gen2i test signals are: 1) a 750MHz +/- 0.035% square wave (which is a D24.3, 00110011
pattern) with risetime between 67ps and 136ps 20 to 80% [1] with a sinusoidal phase modulation of 20.8ns +/- 10%
peak to peak at 30kHz +/- 1%. 2) a 750MHz square wave with a sinusoidal phase modulation of 100ps +/- 10%
peak to peak at 50MHz +/- 1%. 3) a 750MHz square wave with no modulation.
The three Gen3i test signals are: 1) a 1500MHz +/- 0.035% square wave (which is a D24.3, 00110011
pattern) with risetime between 33ps and 67ps (20 to 80%) [1] with a sinusoidal phase modulation of 1.0ns +/- 10%
peak to peak at 420kHz +/- 1%. 2) a 1500MHz square wave with a sinusoidal phase modulation of 50ps +/- 10%
peak to peak at 50MHz +/- 1%. 3) a 1500MHz square wave with no modulation.
An independent separate means of verification of the test signals is used to make sure the level of the
modulation is correct.
The test procedure checks two conditions: the JTF attenuation and the JTF bandwidth. Care is taken to
minimize the number of absolute measurements taken, making most relative; this reduces the dependencies and
improves accuracy.
1. For Gen1 and Gen 2 calibration, adjust the pattern generator for a D24.3 pattern (00110011, with a risetime
within specified limits) modulation to produce a 30 KHz +/- 1%, 20.8 ns p-p +/- 10% sinusoidal phase
modulation. For Gen 3 calibration, adjust the pattern generator for a D24.3 pattern (00110011, with a
risetime within specified limits) modulation to produce a 420kHz +/- 1%, 1.0 ns p-p +/- 10% sinusoidal
phase modulation.
Manymanuals.com
Manymanuals.de
Manymanuals.fr
Manymanuals.it
Manymanuals.pl
Manymanuals.cz
Manymanuals.es
Manymanuals-pt.com
Comentarios a estos manuales